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Wafer Fully Automatic High-Speed LED Chip Prober NPB-600A

We have successfully adopted a unique measurement method that significantly improves production efficiency.

The NPB-600A is a device that inspects the optical and electrical characteristics, as well as the appearance images, of diced LED chips (elements). It performs all measurements and appearance inspections automatically, including wafer replacement. By adopting a unique measurement method, it has successfully significantly improved production efficiency, achieving a cycle time of Max 0.07 seconds per unit. For more details, please contact us or refer to the catalog.

  • probe

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